SN74BCT8240ADWR

Mfr. #:: SN74BCT8240ADWR
설명:: Buffers & Line Drivers Device w/Octal Inverting Buffers
수명 주기:: 이 제조업체의 새 제품입니다.
데이터 시트:: SN74BCT8240ADWR 데이터 시트
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추가 정보:: SN74BCT8240ADWR 추가 정보 SN74BCT8240ADWR Product Details

제품 속성
속성 값

제조사:: 텍사스 인스트루먼트

제품 카테고리:: 버퍼 및 라인 드라이버

RoHS:: Y

입력 라인 수:: 8 Input

출력 라인 수:: 8 Output

극성:: 반전

공급 전압 - 최대:: 5.5 V

공급 전압 - 최소:: 4.5 V

최소 작동 온도:: 0 C

최대 작동 온도:: + 70 C

장착 스타일:: SMD/SMT

패키지/케이스:: SOIC-24 Wide

포장:: 릴

기능:: 스캔 버퍼/라인 드라이버

키:: 2.35 mm

길이:: 15.4 mm

출력 유형:: 3-State

대기 전류:: 35 mA

기술:: 비씨모스

너비:: 7.52 mm

상표:: 텍사스 인스트루먼트

논리 제품군:: BCT

논리 유형:: 경계 스캔(JTAG) 로직

채널 수:: 8

공급 전류 - 최대:: 52000 uA

높은 수준의 출력 전류:: - 15 mA

입력 신호 유형:: 단일 종단

저수준 출력 전류:: 64 mA

작동 공급 전압:: 4.5 V to 5.5 V

상품 유형:: 버퍼 및 라인 드라이버

전파 지연 시간:: 7.5 ns at 5 V

공장 팩 수량:: 1

하위 카테고리:: 논리 IC

단위 무게:: 0.038731 oz

Tags: SN74BCT8240ADWR, SN74BCT8240AD, SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7

Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74BCT8240ADWR 설명

***i-Key: IC SCAN TEST DEVICE BUFF 24-SOIC

***as Instruments: The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.

Market price

부분 #	설명	재고	가격
SN74BCT8240ADWR DISTI # SN74BCT8240ADWR-ND	IC SCAN TEST DEVICE BUFF 24-SOIC RoHS: Compliant Min Qty: 2000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74BCT8240ADWRE4 DISTI # SN74BCT8240ADWRE4-ND	IC SCAN TEST DEVICE BUFF 24-SOIC RoHS: Compliant Min Qty: 2000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74BCT8240ADWRG4 DISTI # SN74BCT8240ADWRG4-ND	IC SCAN TEST DEVICE 24SOIC RoHS: Compliant Min Qty: 2000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74BCT8240ADWR DISTI # 595-SN74BCT8240ADWR	Buffers & Line Drivers Device w/Octal Inverting Buffers RoHS: Compliant	0
SN74BCT8240ADWRE4 DISTI # 595-SN74BCT8240ADWRE	Specialty Function Logic Prog PCM w/Microphn Amps & Speaker Drvr RoHS: Compliant	0
SN74BCT8240ADWRG4 DISTI # 595-74BCT8240ADWRG4	Specialty Function Logic IEEE Std 1149.1 Bndry Sacn Tst Devic RoHS: Compliant	0
SN74BCT8240ADWR	Boundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDSO24 RoHS: Compliant	30000	1000:$6.7600 500:$7.1200 100:$7.4100 25:$7.7300 1:$8.3200

관련 상품

영상	부분 #	설명
	Mfr.#: SN74BCT244DWR OMO.#: OMO-SN74BCT244DWR	Buffers & Line Drivers Octal
	Mfr.#: SN74BCT125ADR OMO.#: OMO-SN74BCT125ADR	Buffers & Line Drivers Quad Bus Buff Gate With 3-State Outputs
	Mfr.#: SN74BCT25245DWG4 OMO.#: OMO-SN74BCT25245DWG4	Bus Transceivers Octal 25 Ohm Bus Transceivers
	Mfr.#: SN74BCT240DWRG4 OMO.#: OMO-SN74BCT240DWRG4	Buffers & Line Drivers Octal Buffers and Line Drivers
	Mfr.#: SN74BCT8374ANT OMO.#: OMO-SN74BCT8374ANT	Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop
	Mfr.#: SN74BCT756N OMO.#: OMO-SN74BCT756N-TEXAS-INSTRUMENTS	Buffers & Line Drivers Octal Buffer/Line Drive
	Mfr.#: SN74BCT2245NS OMO.#: OMO-SN74BCT2245NS-1190	IC TRANSCVR 3ST OCTAL 20SO
	Mfr.#: SN74BCT2420FNR OMO.#: OMO-SN74BCT2420FNR-1190	신규 및 오리지널
	Mfr.#: SN74BCT374N OMO.#: OMO-SN74BCT374N-TEXAS-INSTRUMENTS	Flip Flops Octal D-Type Edge-Trgrd Flip-Flop
	Mfr.#: SN74BCT8245ADW OMO.#: OMO-SN74BCT8245ADW-TEXAS-INSTRUMENTS	Specialty Function Logic IEEE 1149.1

유효성

재고:: Available
주문 시:: 5500
수량 입력:

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SN74BCT8240ADWR

Step1:Vacuum Packaging with PL

Step2:Anti-Static Bag

Step3:Packaging Boxes

Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes