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SN74BCT8240ADWR

SN74BCT8240ADWR
Mfr. #:
SN74BCT8240ADWR
설명:
IC SCAN TEST DEVICE BUFF 24-SOIC
수명 주기:
이 제조업체의 새 제품입니다.
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SN74BCT8240ADWR 데이터 시트
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SN74BCT8240ADWR 추가 정보 SN74BCT8240ADWR Product Details
제품 속성
속성 값
Tags
SN74BCT8240ADWR, SN74BCT8240AD, SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE BUFF 24-SOIC
***as Instruments
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
부분 # 설명 재고 가격
SN74BCT8240ADWR
DISTI # SN74BCT8240ADWR-ND		IC SCAN TEST DEVICE BUFF 24-SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74BCT8240ADWRE4
    DISTI # SN74BCT8240ADWRE4-ND    		IC SCAN TEST DEVICE BUFF 24-SOIC
    RoHS: Compliant
    Min Qty: 2000
    Container: Tape & Reel (TR)    		Limited Supply - Call
      SN74BCT8240ADWRG4
      DISTI # SN74BCT8240ADWRG4-ND      		IC SCAN TEST DEVICE 24SOIC
      RoHS: Compliant
      Min Qty: 2000
      Container: Tape & Reel (TR)      		Limited Supply - Call
        SN74BCT8240ADWR
        DISTI # 595-SN74BCT8240ADWR        		Buffers & Line Drivers Device w/Octal Inverting Buffers
        RoHS: Compliant        		0
          SN74BCT8240ADWRE4
          DISTI # 595-SN74BCT8240ADWRE          		Specialty Function Logic Prog PCM w/Microphn Amps & Speaker Drvr
          RoHS: Compliant          		0
            SN74BCT8240ADWRG4
            DISTI # 595-74BCT8240ADWRG4            		Specialty Function Logic IEEE Std 1149.1 Bndry Sacn Tst Devic
            RoHS: Compliant            		0
              SN74BCT8240ADWRBoundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDSO24
              RoHS: Compliant              		30000
              • 1000:$6.7600
              • 500:$7.1200
              • 100:$7.4100
              • 25:$7.7300
              • 1:$8.3200
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              Mfr.#: SN74BCT240DW

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              SN74BCT2241N

              Mfr.#: SN74BCT2241N

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              SN74BCT2953NT

              Mfr.#: SN74BCT2953NT

              OMO.#: OMO-SN74BCT2953NT-1190

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              OMO.#: OMO-SN74BCT29843NT-TEXAS-INSTRUMENTS

              		 IC LATCH D-TYPE 9BIT BUS 24-DIP
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              Mfr.#: SN74BCT8373NT

              OMO.#: OMO-SN74BCT8373NT-1190

              		 Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24
              SN74BCT8374ADWRE4

              Mfr.#: SN74BCT8374ADWRE4

              OMO.#: OMO-SN74BCT8374ADWRE4-TEXAS-INSTRUMENTS

              		 IC SCAN TEST DEVICE W/FF 24-SOIC
              SN74BCT8245ADWR

              Mfr.#: SN74BCT8245ADWR

              OMO.#: OMO-SN74BCT8245ADWR-TEXAS-INSTRUMENTS

              		 Specialty Function Logic Device w/Octal Bus Transceive
              유효성
              재고:
              Available
              주문 시:
              2500
              수량 입력:
              SN74BCT8240ADWR의 현재 가격은 참고용이며 최상의 가격을 원하시면 판매팀 [email protected]으로 문의 또는 다이렉트 이메일을 보내주십시오.
              참고 가격(USD)
              수량
              단가
              내선 가격
              1
              US$11.34
              US$11.34
              10
              US$10.77
              US$107.73
              100
              US$10.21
              US$1 020.60
              500
              US$9.64
              US$4 819.50
              1000
              US$9.07
              US$9 072.00
              시작
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